"What is Scanning Electron Microscopy (SEM) used for? "

The "What's in it for ...?" seminars organized by the UAR and the various technology and service platforms of the Chemistry Research Cluster are designed to help you discover or deepen your knowledge of the technical possibilities offered by the analysis and characterization equipment at your disposal.

Come and discover Scanning Electron Microscopy (SEM) with the JEOL IT510LV on June 12. This seminar provides an introduction to the capabilities of the JEOL IT510LV scanning electron microscope (PAC Balard, Service MEA), illustrated by concrete examples of characterization: observation in partial vacuum for sensitive samples, EBSD (electron backscatter diffraction) analysis for the study of crystal structure and grain orientation, and EDS (energy dispersive spectroscopy) analysis for the rapid and precise identification of the chemical elements present. A versatile, affordable instrument for chemistry and materials science!

Speakers

• Fabrice Barou - Géosciences Montpellier
  Presentation of the platform and the EBSD technique
• Calypso Baril - ICGM, MEA
  SEM and EDS demonstrations
  

About the speakers

Fabrice Barou has been a CNRS research engineer at Géosciences Montpellier since 2009. In charge of GM's EBSD platform, he manages a national INSU instrument. He is a specialist in microstructural analysis and the EBSD technique.

Calypso Baril works in the MEA (Electronic and Analytical Microscopy) Department at PAC Chimie Balard. After an initial stint at the technical platform between 2016 and 2019, she returns in 2019. She specializes in SEM, with a complementary practice in transmission electron microscopy (TEM). She is also responsible for the technical hall of Polytech's Materials department.

Possibility of credit validation for doctoral students

For further information, please contact us by e-mail.