What is the purpose of Scanning Electron Microscopy (SEM)?

The "What is it used for?" seminars organized by the UAR and the various technology and service platforms of the Chemistry Research Cluster aim to introduce or deepen knowledge about the technical capabilities of the analysis and characterization equipment available to you.

On June 12, come and discover Scanning Electron Microscopy (SEM) with the JEOL IT510LV. This seminar offers an introduction to the capabilities of the JEOL IT510LV scanning electron microscope (PAC Balard, MEA Service), illustrated with concrete examples of characterization: partial vacuum observation for sensitive samples, EBSD (electron backscatter diffraction) analysis for studying crystal structure and grain orientation, and EDS (energy dispersive spectroscopy) analysis for rapid and accurate identification of chemical elements present. A versatile and accessible device for chemistry and materials science!

Speakers

• Fabrice Barou – Geosciences Montpellier
  Presentation of the platform and the EBSD technique
• Calypso Baril – ICGM, MEA
  SEM and EDS demonstrations
  

About the speakers

Fabrice Barou has been a CNRS research engineer at Géosciences Montpellier since 2009. As head of GM's EBSD platform, he manages a national INSU instrument. He specializes in microstructural analysis and EBSD technology.

Calypso Baril works in the MEA (Electron Microscopy and Analysis) Department at PAC Chimie Balard. After an initial stint at the technical platform between 2016 and 2019, she returned there in 2019. She specializes in SEM, with additional experience in transmission electron microscopy (TEM). She is also responsible for the technical hall of the Materials Department at Polytech.

Possibility of credit validation for doctoral students

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