“What is scanning electron microscopy (SEM) used for?”

The “What is … used for?” seminars organized by the UAR and the various technology and service platforms of the Chemistry Research Cluster are designed to help you discover or deepen your understanding of the technical capabilities of the analytical and characterization equipment available to you.

On June 12, come learn about Scanning Electron Microscopy (SEM) with the JEOL IT510LV. This seminar offers an introduction to the capabilities of the JEOL IT510LV scanning electron microscope (PAC Balard, MEA Department), illustrated by concrete examples of characterization: observation under partial vacuum for sensitive samples, EBSD (electron backscatter diffraction) analysis for studying crystal structure and grain orientation, as well as EDS (energy-dispersive spectroscopy) analysis for the rapid and precise identification of chemical elements present. A versatile and accessible instrument for chemistry and materials science!

Speakers

• Fabrice Barou – Géosciences Montpellier
  Presentation of the platform and EBSD technique
• Calypso Baril – ICGM, MEA
  SEM and EDS demonstrations
  

About the speakers

Fabrice Barou has been a CNRS research engineer at Géosciences Montpellier since 2009. As head of the GM EBSD platform, he oversees, among other things, a national INSU instrument. He specializes in microstructural analysis and EBSD techniques.

Calypso Baril works in the MEA (Electron Microscopy and Analysis) Department at the PAC Chimie Balard. After an initial stint in the technical facility between 2016 and 2019, she returned there in 2019. She specializes in SEM, with additional experience in transmission electron microscopy (TEM). She is also in charge of the technical facility for the Materials Department at Polytech.

Option for doctoral students to earn academic credit

For any inquiries, please contact us by email.